Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons: 209 (Springer Tracts in Modern Physics, 209) - Hardcover
Book 109 of 227: Springer Tracts in Modern Physics
Synopsis
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.
A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
"synopsis" may belong to another edition of this title.
Other Popular Editions of the Same Title
Search results for Infrared Ellipsometry on Semiconductor Layer Structures:...
Stock Image
Infrared Ellipsometry on Semiconductor Layer Structures. Phonons, Plasmons, and Polaritons.
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Seller rating 4 out of 5 stars
77 figs., XI, 193 p. Hardcover Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Springer Tracts in Modern Physics, Vol. 209. Sprache: Englisch. Seller Inventory # 3908AB
Stock Image
Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics, 209)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In. Seller Inventory # ria9783540232490_new
Buy New
£ 209.52
£ 11.98 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: Over 20 available
Seller Image
Infrared Ellipsometry on Semiconductor Layer Structures
Published by
Springer Berlin Heidelberg, 2004
ISBN 10: 3540232494
ISBN 13: 9783540232490
New
Hardcover
Seller: moluna, Greven, Germany
Seller rating 5 out of 5 stars
Condition: New. Describes a powerful new method for investigating semiconductor layer structuresAuthor is a leading expert in the fieldThe study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spe. Seller Inventory # 4885851
Buy New
£ 229.29
£ 42.36 shipping
Ships from Germany to U.S.A.
Ships from Germany to U.S.A.
Quantity: Over 20 available
Seller Image
Infrared Ellipsometry on Semiconductor Layer Structures : Phonons, Plasmons, and Polaritons
Published by
Springer, Berlin, Springer, 2004
ISBN 10: 3540232494
ISBN 13: 9783540232490
New
Hardcover
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. Neuware - The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed. Seller Inventory # 9783540232490