Infrared Ellipsometry on Semiconductor Layer Structures - Softcover

Book 109 of 227: Springer Tracts in Modern Physics

Schubert, Mathias

 
9783540804291: Infrared Ellipsometry on Semiconductor Layer Structures

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9783540232490: Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons: 209 (Springer Tracts in Modern Physics, 209)

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ISBN 10:  3540232494 ISBN 13:  9783540232490
Publisher: Springer, 2004
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