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Failure Analysis of Integrated Circuits: Tools and Techniques: 494 (The Springer International Series in Engineering and Computer Science, 494) - Softcover
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
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- PublisherSpringer
- Publication date2012
- ISBN 10 1461372313
- ISBN 13 9781461372318
- BindingPaperback
- Number of pages268
- EditorWagner Lawrence C.
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Failure Analysis of Integrated Circuits (The Springer International Series in Engineering and Computer Science) by C.Wagner, Lawrence [Paperback ]
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Failure Analysis of Integrated Circuits : Tools and Techniques
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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science, 494)
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(2012)
ISBN 10: 1461372313
ISBN 13: 9781461372318
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Failure Analysis of Integrated Circuits
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Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 272 pp. Englisch. Seller Inventory # 9781461372318
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Failure Analysis of Integrated Circuits
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Book Description Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa. Seller Inventory # 4195376
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Failure Analysis of Integrated Circuits : Tools and Techniques
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(2012)
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ISBN 13: 9781461372318
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Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers. Seller Inventory # 9781461372318
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