Synopsis
Introduction to VLSI Testing.- Delay Test and System-Delay Defects.- Long Path-Based Hybrid Method.- Process Variations- and Crosstalk-Aware Pattern Selection.- Power Supply Noise- and Crosstalk-Aware Hybrid Method.- SDD-Based Hybrid Method.- Maximizing Crosstalk Effect on Critical Paths.- Maximizing Power Supply Noise on Critical Paths.- Faster-than-at-speed Test.- Introduction to Diagnosis.- Diagnosing Noise-Induced SDDs by Using Dynamic SDF.
"synopsis" may belong to another edition of this title.
