Fundamentals of Powder Diffraction and Structural Characterization of Materials - Hardcover

Pecharsky, Vitalij; Zavalij, Peter

Hardcover

ISBN 10: 1402073658 ISBN 13: 9781402073656

Publisher: Kluwer Academic Publishers, 2003

Synopsis

This work provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is divided into two parts: chapters 1-3 give essential theoretical background, while chapters 4-7 guide the reader through practical aspects of extracting structural information from powder data. The book is supplemented by a compact disc containing experimental data collected from a variety of materials that are used as examples and in the problems offered at the end of every chapter. In addition colour electronic versions of some 300 illustrations found throughout the book will be included. The book is designed for both the undergraduate and graduate students from materials science, solid-state chemistry, physics, geology, and literally any other science or engineering background, who demand structural information at the atomic resolution.

About this title

Review

The book is well written and organized. The authors’ enthusiasm and dedication to the subject matter are clearly evident. I find the book to be not only an excellent introduction to structural characterization, but also a valuable introduction to the world of the working crystallographer. The text is rich in references to internet resources, software, literature, organizations, databases, and institutions that x-ray researchers employ routinely.

As a class text the book could be used in an introductory course for third or fourth year undergraduates in materials science, chemistry, physics, or geochemistry. The detailed structural treatments may be too much for the typical introductory x-ray diffraction course, but students would be adding a valuable text for future reference to their libraries. The sections are also ideal for more advanced coursework at the graduate level. Beyond the classroom, any researcher desiring structural information on materials would benefit from this book.

Materials Today, July/August 2004

From the Back Cover

Fundamentals of Powder Diffraction and Structural Characterization of Materials provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is divided into two parts: chapters one though three give essential theoretical background, while chapters four through seven guide the reader through practical aspects of extracting structural information from powder data.  In addition color electronic versions of some 300 illustrations found throughout the book will be included. The book is designed for both the undergraduate and graduate students from materials science, solid-state chemistry, physics, geology, and literally any other science or engineering background, who demand structural information at the atomic resolution. Key features: The book requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method. The book is useful for any scientific or engineering background, where precise structural information is required. The book comprehensively describes the state-of-the-art in structure determination from powder diffraction data both theoretically and practically using multiple examples of varying complexity. Particular attention is paid to the utilization of the Internet resources, especially the well-tested and freely available computer codes designed for processing of powder diffraction data.

Edition details

• Publisher: Kluwer Academic Publishers
• Publication date: 2003
• Language: English
• ISBN 10: 1402073658
• ISBN 13: 9781402073656
• Binding: Hardcover
• Number of pages: 736