VLSI Design for Manufacturing: Yield Enhancement: 86 (The Springer International Series in Engineering and Computer Science, 86) - Hardcover
Synopsis
One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.
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Vlsi Design for Manufacturing: Yield Enhancement
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Hardcover. Condition: Très bon. Ancien livre de bibliothèque. Petite(s) trace(s) de pliure sur la couverture. Légères traces d'usure sur la couverture. Salissures sur la tranche. Edition 1990. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Slightly creased cover. Slight signs of wear on the cover. Stains on the edge. Edition 1990. Ammareal gives back up to 15% of this item's net price to charity organizations. Seller Inventory # E-812-698
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VLSI Design for Manufacturing: Yield Enhancement
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VLSI Design for Manufacturing: Yield Enhancement (International Series in Engineering and Computer Science)
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Kluwer Academic Publishers, 1989
ISBN 10: 0792390547
ISBN 13: 9780792390541
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VLSI Design for Manufacturing: Yield Enhancement (The Springer International Series in Engineering and Computer Science, 86)
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VLSI Design for Manufacturing: Yield Enhancement (The Springer International Series in Engineering and Computer Science, 86)
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VLSI Design for Manufacturing: Yield Enhancement
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufac. Seller Inventory # 5971233
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VLSI Design for Manufacturing: Yield Enhancement
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Buch. Condition: Neu. VLSI Design for Manufacturing: Yield Enhancement | Stephen W. Director (u. a.) | Buch | xii | Englisch | 1989 | Springer US | EAN 9780792390541 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Seller Inventory # 102442976
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VLSI Design for Manufacturing: Yield Enhancement
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Springer US, Springer US Nov 1989, 1989
ISBN 10: 0792390547
ISBN 13: 9780792390541
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Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as 'design for manufacture' or 'statistical design'. As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 308 pp. Englisch. Seller Inventory # 9780792390541
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VLSI Design for Manufacturing: Yield Enhancement
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as 'design for manufacture' or 'statistical design'. As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book. 308 pp. Englisch. Seller Inventory # 9780792390541
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VLSI Design for Manufacturing: Yield Enhancement
Published by
Springer US, Springer US, 1989
ISBN 10: 0792390547
ISBN 13: 9780792390541
New
Hardcover
Seller: AHA-BUCH GmbH, Einbeck, Germany
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as 'design for manufacture' or 'statistical design'. As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book. Seller Inventory # 9780792390541