Defects in SiO2 and Related Dielectrics: Science and Technology: 2 (NATO Science Series II: Mathematics, Physics and Chemistry, 2) - Softcover
Book 4 of 241: NATO Science Series II: Mathematics, Physics and Chemistry
Synopsis
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.
"synopsis" may belong to another edition of this title.
Other Popular Editions of the Same Title
Search results for Defects in SiO2 and Related Dielectrics: Science and...
Stock Image
Defects in Sio2 and Related Dielectrics : Science and Technology
Seller: Better World Books: West, Reno, NV, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. Seller Inventory # 56733615-75
Seller Image
Defects in Si02 and Related Dielectrics : Science and Technology
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # 5891203-n
Buy New
£ 181.99
£ 15 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: Over 20 available
Stock Image
Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In. Seller Inventory # ria9780792366867_new
Buy New
£ 187.59
£ 11.98 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: Over 20 available
Seller Image
Defects in Si02 and Related Dielectrics : Science and Technology
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # 5891203-n
Stock Image
Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2)
Seller: California Books, Miami, FL, U.S.A.
Seller rating 4 out of 5 stars
Condition: New. Seller Inventory # I-9780792366867
Seller Image
Defects in SiO2 and Related Dielectrics: Science and Technology
Print on DemandSeller: moluna, Greven, Germany
Seller rating 5 out of 5 stars
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000 Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-ox. Seller Inventory # 5969608
Buy New
£ 161.53
£ 42.67 shipping
Ships from Germany to U.S.A.
Ships from Germany to U.S.A.
Quantity: Over 20 available
Seller Image
Defects in Si02 and Related Dielectrics : Science and Technology
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition. Seller Inventory # 5891203
Seller Image
Defects in SiO2 and Related Dielectrics: Science and Technology
Published by
Springer Netherlands Dez 2000, 2000
ISBN 10: 0792366867
ISBN 13: 9780792366867
New
Taschenbuch
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy. 636 pp. Englisch. Seller Inventory # 9780792366867
Seller Image
Defects in Si02 and Related Dielectrics : Science and Technology
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition. Seller Inventory # 5891203
Buy Used
£ 204.91
£ 15 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: Over 20 available
Seller Image
Defects in SiO2 and Related Dielectrics: Science and Technology
Seller: preigu, Osnabrück, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. Defects in SiO2 and Related Dielectrics: Science and Technology | Gianfranco Pacchioni (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2000 | Springer | EAN 9780792366867 | Verantwortliche Person für die EU: Springer Netherlands, Haberstr. 7, 69126 Heidelberg, buchhandel-buch[at]springer[dot]com | Anbieter: preigu. Seller Inventory # 101889627