Synopsis
A classic series in the field of quantitative measurement, Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance. 1989 edition.
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About the Author
David H. Krantz is affiliated with Columbia University; R. Duncan Luce with the University of California, Irvine, and Patrick Suppes with Stanford University. Amos Tversky is deceased.
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Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations (Dover Books on Mathematics)
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Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations Volume 2
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Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations (Dover Books on Mathematics)
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Foundations of Measurement Vol. II : Geometrical, Threshold, and Probabilistic Representations
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Foundations of Measurement : Geometrical, Threshold, and Probabilistic Representations
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Geometrical, Threshold, and Probabilistic Representations (Paperback or Softback)
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Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations (Dover Books on Mathematics)
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Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations (Dover Books on Mathematics)
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Geometrical, Threshold, and Probabilistic Representations
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ISBN 10: 0486453154
ISBN 13: 9780486453156
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