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Advances in X-Ray Analysis: Volume 37: Vol.37 (Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,) - Hardcover
Synopsis
89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.
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Synopsis
Selected papers from the 1993 Denver Conference on Applications of X-Ray Analysis. International experts present the latest research in the field, with special coverage of the impact of personal computers and sophisticated software on the development of X-ray instrumentation and techniques. Annotation copyright Book News, Inc. Portland, Or.
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Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,: Vol.37
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Kluwer Academic Publishers Group, 1994
ISBN 10: 0306449013
ISBN 13: 9780306449017
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