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Proceedings of Combined First Pacific-International Conference on X-Ray Analytical Methods and Fortieth Annual Conference on Applications of X-Ray ... 35): Volume 35B (Advances in X-Ray Analysis) - Hardcover
Synopsis
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
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Synopsis
The proceedings of the combined First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis, held in Hilo and Honolulu Hawaii, August 1991, comprise reports on the latest developments in international research on X-ray fluorescence and X-ray diffraction techniques. For s
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- PublisherKluwer Academic/Plenum Publishers
- Publication date1992
- ISBN 10 0306442493
- ISBN 13 9780306442490
- BindingHardcover
- LanguageEnglish
- Number of pages1334
- EditorBarrett Charles S., Gilfrich John V., Huang Ting C., Jenkins Ron, McCarthy G. J., Predecki Paul K., Ryon R., Smith Deane K.
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ADVANCES IN X - RAY ANALYSIS
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Advances In X - Ray Analysis
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Advances In X-ray Analysis
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Advances in X-Ray Analysis
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Advances in X-Ray Analysis
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