Testing of Digital Systems. This item is unavailable.
Language: English
Published by Cambridge University Press, 2003
- First Edition
- Hardcover
- Used
Seller: Better World Books Ltd, Dunfermline, United KingdomBetter World Books Ltd
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Hardcover
Condition: Used - Very good
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Item description from seller
Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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- Title
- Testing of Digital Systems
- Author
- Jha, Niraj, Gupta, Sandeep
- Publisher
- Cambridge University Press
- Publication year
- 2003
- Condition
- Very Good
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0521773563
- ISBN 13
- 9780521773560
- Edition
- 1st Edition.
- Item weight
- 4.817 pounds
- Dimensions
- N/A
The most comprehensive and wide ranging book on the testing of semiconductor devices and systems.
"Synopsis" may belong to another edition of this title.
About the Author
Niraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, associate editor of IEEE Transactions on VLSI Systems and The Journal of Electronic Testing: Theory and Applications (JETTA) and a recipient of the AT&T Foundation award and the NEC preceptorship award for research excellence.
Sandeep Gupta is an Associate Professor in the Department of Electrical Engineering at the University of Southern California, USA. He is Co-Director of the M.S. Program in VLSI Design, with research interests in the area of VLSI testing and design. He is a member of the IEEE.
Sandeep Gupta is an Associate Professor in the Department of Electrical Engineering at the University of Southern California, USA. He is Co-Director of the M.S. Program in VLSI Design, with research interests in the area of VLSI testing and design. He is a member of the IEEE.
"About the title" may belong to another edition of this title.