Statistical Regression with Measurement Error (Hardcover)

Chi-Lun Cheng

ISBN 10: 047071106X / ISBN 13: 9780470711064

Published by John Wiley & Sons Inc, New York, 1999

About this Item

Hardcover. Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format. Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

Seller Inventory # 9780470711064

Bibliographic Details

• Title: Statistical Regression with Measurement Error (Hardcover)
• Publisher: John Wiley & Sons Inc, New York
• Publication Date: 1999
• Language: English
• ISBN 10: 047071106X
• ISBN 13: 9780470711064
• Binding: Hardcover
• Edition: 1st Edition
• Condition: new

About this title

Synopsis

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

About the Author

Chi-Lun Cheng and John W. Van Ness are the authors of Statistical Regression with Measurement Error: Kendall's Library of Statistics 6, published by Wiley.