Statistical Regression with Measurement Error

Language: English

Published by John Wiley and Sons Inc, US, 2010

047071106X / 9780470711064

  • First Edition
  • Hardcover
  • New
See all details

Seller: Rarewaves.com UK, London, United KingdomRarewaves.com UK

5-star seller

AbeBooks seller since June 11, 2025

Hardcover

Condition: New

£ 82.58

£ 65.00 shipping 
Ships from United Kingdom to U.S.A.

Quantity: Over 20 available

Add to basket
Free 30-day returns

Item description from seller

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

Seller Inventory # LU-9780470711064

Title
Statistical Regression with Measurement Error
Author
Chi-Lun Cheng, John W. Van Ness
Publisher
John Wiley and Sons Inc, US
Publication year
2010
Condition
New
Binding
Hardback
Language
English
ISBN 10
047071106X
ISBN 13
9780470711064
Edition
1st.
Item weight
567 grams
Dimensions
16.57 x 2.27 x 24.12 cm

Rarewaves.com UK

London, United Kingdom

5-star seller

AbeBooks seller since June 11, 2025

Shipping rates from United Kingdom to U.S.A.

Item60 to 60 business days60 to 60 business days
First item£ 65.00£ 100.00
Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.

Payment methods

  • Visa
  • Mastercard
  • American Express
  • Apple Pay
  • Google Pay

Seller's business information

RAREWAVES.COM LIMITED

Elsley Court, 20-22 Great Titchfield Street
London, United Kingdom W1W 8BE