Speckle Metrology / Quantum Electronics Principles and Applications

Erf, Robert K., edited by

ISBN 10: 0122413601 / ISBN 13: 9780122413605

Published by Academic Press, Inc., a subsidiary of Harcourt, Btace, Jovanovich, Publishers, New York - San Francisco - London, 1978

About this Item

One of a series of monographs edited by Yoh-Han Pao and Paul Kelley. Numerous contributors including A. Luxmoore of the University College of Swansea and A. Tiziani of Wild Heerbrugg Ltd., Heerbrugg, Switzerland. Mr. Erf was of the United Technologies Research Center, East Hartford, Conn. Surface Roughness Measurement; Displacement and Strain Measurement; Vibration Analysis and Deformation Measurement; Electronic Speckle Pattern Interferometry; Topological Speckle and Structures Inspection; Measurement of Crystal Length Changes; Measurement of Displacement Around Crack Tips, etc. On a nice coated stock, well illustrated with diagrams and B&W plates. 331 pp. including index. Reduced from $45.

Seller Inventory # 003010

Bibliographic Details

• Title: Speckle Metrology / Quantum Electronics Principles and Applications
• Publisher: Academic Press, Inc., a subsidiary of Harcourt, Btace, Jovanovich, Publishers, New York - San Francisco - London
• Publication Date: 1978
• Language: English
• ISBN 10: 0122413601
• ISBN 13: 9780122413605
• Binding: Hardcover
• Edition: 1st Edition
• Condition: As New
• Dust Jacket Condition: Near Fine
• Seller catalogs:
  • Physics
  • Electrical Engineering