Precision X-Ray Optical Depth Measurements in ICF Shells; GA-A25658

Eddinger, S. A., and Stephens, R. B., and Huang, H., and Drake, T. J., and Nikroo, A., and Flint, G., and Bystedt, C. R.

Published by General Atomics, San Diego, CA, 2007

About this Item

[2], 5, [1] pages. Illustrations. References. This is a preprint of a paper presented at the 17th Target Fabrication Specialist Meeting, San Diego, California on October 1-5, 2006 and to be published in Fusion Science and Technology. This is part of General Atomics Project 30272. General Atomics is an American energy and defense corporation headquartered in San Diego, California, specializing in research and technology development. This includes physics research in support of nuclear fission and nuclear fusion energy. The company also provides research and manufacturing services for remotely operated surveillance aircraft, including the Predator drones; airborne sensors; and advanced electric, electronic, wireless, and laser technologies. The experimenters built a precision radiography system that measures shells for all current ablator materials to an accuracy of 1:10 4 in optical depth fluctuation and a spatial resolution of 120 m. The data obtained by the precision radiography system for undoped shells was compared with the data taken using the well-known surface measurement technique Spheremapper. Since both techniques yielded the same power spectrum for the same shell, the results of the precision radiography system were verified. When this technique is compared to the Be:Cu NIF shell, there is no significant internal layer fluctuation. To account for the growing measurement demand, a new x-ray system to accommodate measurements in 1 working day was designed. Presumed First Edition, First printing thus [Conference Preprint].

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Bibliographic Details

• Title: Precision X-Ray Optical Depth Measurements in ICF Shells; GA-A25658
• Publisher: General Atomics, San Diego, CA
• Publication Date: 2007
• Binding: Wraps
• Edition: 1st Edition
• Condition: Very good