Polarization Analysis and Applications to Device Technology, International Symposium on - Volume 2873, Proceedings of SPIE - The International Society for Optical Engineering, 12-14 June 1996, Yokohama, Japan

Azzam, R. M. A.; Chipman, R. A.; Kiriyama, H.; et.al.

ISBN 10: 0819422711 ISBN 13: 9780819422712
Published by The International Society for Optical Engineering, Bellingham, WA, U.S.A., 1996
Language: English
Condition: Used - Very good Soft cover

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