Microlithography and Metrology in Micromachining II - Volume 2880, Proceedings of SPIE - The International Society for Optical Engineering, 14-15 October 1996, Austin, Texas

Postek, Michael T.; Friedrich, Craig (Eds); et.al.

ISBN 10: 0819422789 ISBN 13: 9780819422781
Published by The International Society for Optical Engineering, Bellingham, WA, U.S.A., 1996
Language: English
Condition: Used - Very good Soft cover

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Used - Soft cover

Condition: Used - Very good

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