On Line-testing for VLSI

. Ed(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K.

ISBN 10: 1441950338 / ISBN 13: 9781441950338

Published by Springer-Verlag New York Inc., 2010

About this Item

Editor(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFC; UGC. Category: (P) Professional & Vocational. Dimension: 254 x 178 x 8. Weight in Grams: 385. . 2010. 1st ed. Softcover of orig. ed. 1998. Paperback. . . . .

Seller Inventory # V9781441950338

Bibliographic Details

• Title: On Line-testing for VLSI
• Publisher: Springer-Verlag New York Inc.
• Publication Date: 2010
• Language: English
• ISBN 10: 1441950338
• ISBN 13: 9781441950338
• Binding: Soft cover
• Edition: 1st Edition
• Condition: New

About this title

Synopsis

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.