High-Resolution Electron Microscopy for Materials Science. This item is unavailable.
Language: English
Published by Springer Japan, 1998
- First Edition
- Softcover
- Used
Seller: Better World Books, Mishawaka, IN, U.S.A.Better World Books
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Softcover
Condition: Used - Good
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Item description from seller
Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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- Title
- High-Resolution Electron Microscopy for Materials Science
- Author
- Shindo, Daisuke; Kenji, Hiraga
- Publisher
- Springer Japan
- Publication year
- 1998
- Condition
- Good
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 4431702342
- ISBN 13
- 9784431702344
- Edition
- 1st Edition.
- Item weight
- 1.367 pounds
- Dimensions
- N/A
High-resolution electron microscopy (H.R.E.M.) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of H.R.E.M. for materials science.
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Product Description
High-resolution Electron Microscopy For Materials Science
"About the title" may belong to another edition of this title.
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