Applications of Optical Metrology -- Techniques and Measurements II - Volume 416, Proceedings of SPIE - The International Society for Optical Engineering, 7-8 April 1983, Arlington, Virginia

Lee Jr., John J. (Ed); et.al.

ISBN 10: 0892524510 ISBN 13: 9780892524518
Published by The International Society for Optical Engineering, Bellingham, WA, U.S.A., 1983
Language: English
Condition: Used - Good Soft cover

Sold by SUNSET BOOKS 2, Newark, OH, U.S.A.

AbeBooks Seller since 31 July 2009

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

View this seller's items


Used - Soft cover

Condition: Used - Good

Price:
£ 23.05
£ 5.41 shipping
Ships within U.S.A.

Quantity: 1 available

Add to basket