X Ray Diffraction Elevated Temperatures by Chung Deborah (1 results)

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X-ray Diffraction at Elevated Temperatures: A Method for In Situ Process Analysis. Chung, Deborah D. L. et. al.
Chung, Deborah D. L. et. al.
Language: English
Published by New York, NY: VCH., 1993
3527278427 / 9783527278428
- Hardcover
Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, GermanyBUCHSERVICE / ANTIQUARIAT Lars Lutzer
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Condition: gut. 1993. X-ray Diffraction at Elevated Temperatures: A Method for In Situ Process Analysis. In deutscher Sprache. pages.