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Testing Reliable Design Cmos by Jha Niraj (19 results)
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Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science, 88)
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 4 out of 5 stars
Condition: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
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Testing and Reliable Design of CMOS Circuits (The Kluwer International Series in Engineering and Computer Science, 88)
Published by Kluwer Academic Publishers, 1990
ISBN 10: 0792390563 ISBN 13: 9780792390565
Language: English
Hardcover. Condition: Very Good. This book has mild rubbing and surface scratching to both covers, light smudging to both covers most notable at the back cover, and faint smudging to the edges of the textblock, otherwise this book is in very good condition with crisp, unmarked pages, a tight binding, and a strong, glossy cover.
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Testing and Reliable Design of CMOS Circuits
Published by Kluwer Academic Publishers, Boston, MA, U. S. A., 1990
ISBN 10: 0792390563 ISBN 13: 9780792390565
Language: English
Seller: PsychoBabel & Skoob Books, Didcot, United Kingdom
Seller rating 5 out of 5 stars
First Edition
hardcover. Condition: Very Good. Dust Jacket Condition: No Dust Jacket. First Edition. Printed boards, no jacket. Exterior a little worn, grubby; previous owner's name on FEP; contents otherwise clean, sound, bright. TPW. Used.
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Testing and Reliable Design of CMOS Circuits
Published by Kluwer Academic Publishers, Boston, 1990
ISBN 10: 0792390563 ISBN 13: 9780792390565
Language: English
Seller: PsychoBabel & Skoob Books, Didcot, United Kingdom
Seller rating 5 out of 5 stars
hardcover. Condition: Very Good. Dust Jacket Condition: No Dust Jacket. Name from previous owner on FEP. No dust jacket. Binding is very well preserved, though with light surface wear to covers. Pages are clean and crisp, and printing is tight, clean and bright throughout. MB. Used.
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Testing and Reliable Design of CMOS Circuits
Published by Kluwer Academic Publishers, Boston, 1990
ISBN 10: 0792390563 ISBN 13: 9780792390565
Language: English
First Edition
Hardcover. Condition: Very Good. Dust Jacket Condition: No Dj. First Edition. Owner's name is signed.
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Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
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Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science, 88)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
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Gebunden. Condition: New.
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Condition: New.
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Condition: New. pp. 248.
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Condition: New. pp. 260.
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Taschenbuch. Condition: Neu. Testing and Reliable Design of CMOS Circuits | Niraj K. Jha (u. a.) | Taschenbuch | xiv | Englisch | 2011 | Springer | EAN 9781461288183 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Paperback. Condition: Like New. Like New. book.
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Condition: New. Print on Demand pp. 248 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Condition: New. Print on Demand pp. 260 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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Condition: New. PRINT ON DEMAND pp. 248.
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Condition: New. PRINT ON DEMAND pp. 260.
