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Scratch Study Identification Detection by Liu Wei (1 results)
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scratch Study identification and detection of electronic components(Chinese Edition)
Published by Defense Industry Press Pub. Date :2007-01-01, 1991
ISBN 10: 7118047651 ISBN 13: 9787118047653
Language: Chinese
£ 46.12
Convert currency£ 11.03 shipping from China to United KingdomQuantity: 3 available
Add to basketSoft cover. Condition: New. Language:Chinese.Author:LIU WEI GUO WANG CHUN SHENG ZHANG TAO LIU JIAN QING.Binding:Soft cover.Publisher:Defense Industry Press Pub. Date :2007-01-01.
