Models Hardware Testing Lecture (9 results)
Language: English
Published by Springer, 2009
Series: Frontiers in Electronic Testing, Book 22 of 40. Book 22 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by Springer, 2009
Series: Frontiers in Electronic Testing, Book 22 of 40. Book 22 of 40 - Frontiers in Electronic Testing
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More imagesLanguage: English
Published by Springer, 2012
Series: Frontiers in Electronic Testing, Book 22 of 40. Book 22 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. Models in Hardware Testing | Lecture Notes of the Forum in Honor of Christian Landrault | Hans-Joachim Wunderlich | Taschenbuch | xiv | Englisch | 2012 | Springer | EAN 9789400730939 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[a…t]springer[dot]com | Anbieter: preigu.
Language: English
Published by Springer, 2012
Series: Frontiers in Electronic Testing, Book 22 of 40. Book 22 of 40 - Frontiers in Electronic Testing
- Softcover
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Language: English
Published by Springer Netherlands, Springer Netherlands, 2012
Series: Frontiers in Electronic Testing, Book 22 of 40. Book 22 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are… introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Language: English
Published by Springer, 2009
Series: Frontiers in Electronic Testing, Book 22 of 40. Book 22 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introd…uced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Language: English
Published by Springer, 2012
Series: Frontiers in Electronic Testing, Book 22 of 40. Book 22 of 40 - Frontiers in Electronic Testing
- Softcover
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Language: English
Published by Springer, 2009
Series: Frontiers in Electronic Testing, Book 22 of 40. Book 22 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by SPRINGER NATURE Dez 2009, 2009
Series: Frontiers in Electronic Testing, Book 22 of 40. Book 22 of 40 - Frontiers in Electronic Testing
- Hardcover
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS techn…ology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. 257 pp. Englisch.
