Microscopic Identification Electronic Defects by Johnson Noble (1 results)
Microscopic Identification of Electronic Defects in Semiconductors (Materia Ls Research Society Symposia Proceedings, Volume 46)
Johnson, Noble M., Stephen G. Bishop, And George D. Watkins, Editors
- Hardcover
Seller: BookDepart, Shepherdstown, WV, U.S.A.BookDepart
Contact seller5-star sellerCondition: Used - Good
£ 25.00
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Hardcover. Condition: UsedGood. Hardcover; symposium held April 15-18, 1985, in San Francisco; fading and s helf wear to exterior; binding slightly cocked; scrape to side edge of fron t cover; note written on table of contents page, otherwise text is clean; f ormer owner's stamping inside rear board; contents in good condition.…
