Material Structure Analysis by Chen Tie (1 results)

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paperback. Condition: New. Language:Chinese.Paperback. Pub Date: 2025-03 Pages: 296 Publisher: Science Press This book covers X-ray powder diffraction. X-ray photoelectron spectroscopy and Auger electron spectroscopy. X-ray absorption fine structure. solid-state nuclear magnetic resonance spectroscopy. electron paramagnetic resonance spectroscopy. gas adsorption technology for porous materials. transmission electron microscopy and electron diffraction. electron energy loss spectroscopy. scanning electron microscopy. sc.…