Published by Springer, 2005
Language: English
Seller: Antiquariat Thomas Haker GmbH & Co. KG, Berlin, Germany
Association Member: GIAQ
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Add to basketHardcover/Pappeinband. Condition: Sehr gut. 156 p. Very good. Shrink wrapped. / Sehr guter Zustand. In Folie verschweißt. Sprache: Englisch Gewicht in Gramm: 496.
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Add to basketCondition: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if youâre not satisfied with purchase please return item for full refund. Ships via media mail.
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Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Published by Springer-Verlag New York Inc., New York, NY, 2010
ISBN 10: 1441938443 ISBN 13: 9781441938442
Language: English
Seller: Grand Eagle Retail, Mason, OH, U.S.A.
First Edition
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Add to basketPaperback. Condition: new. Paperback. Interconnect has become the dominating factor in determining system performance in nanometer technologies. Dedicated to this subject, Interconnect Noise Optimization in Nanometer Technologies provides insight and intuition into layout analysis and optimization for interconnect in high speed, high complexity integrated circuits.The authors bring together a wealth of information presenting a range of CAD algorithms and techniques for synthesizing and optimizing interconnect. Practical aspects of the algorithms and the models are explained with sufficient details. The book investigates the most effective parameters in layout optimization. Different post-layout optimization techniques with complexity analysis and benchmarks tests are provided. The impact crosstalk noise and coupling on the wire delay is analyzed. Parameters that affect signal integrity are also considered. Presents a range of CAD algorithms and techniques for synthesizing and optimizing interconnectProvides insight & intuition into layout analysis and optimization for interconnect in high speed, high complexity integrated circuits Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Seller: Revaluation Books, Exeter, United Kingdom
Paperback. Condition: Brand New. 137 pages. 9.25x6.25x0.37 inches. In Stock.
Published by Springer-Verlag New York Inc, 2005
ISBN 10: 0387258701 ISBN 13: 9780387258706
Language: English
Seller: Revaluation Books, Exeter, United Kingdom
Hardcover. Condition: Brand New. 1st edition. 137 pages. 9.25x6.50x0.75 inches. In Stock.
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Published by Springer-Verlag New York Inc., New York, NY, 2010
ISBN 10: 1441938443 ISBN 13: 9781441938442
Language: English
Seller: AussieBookSeller, Truganina, VIC, Australia
First Edition
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Add to basketPaperback. Condition: new. Paperback. Interconnect has become the dominating factor in determining system performance in nanometer technologies. Dedicated to this subject, Interconnect Noise Optimization in Nanometer Technologies provides insight and intuition into layout analysis and optimization for interconnect in high speed, high complexity integrated circuits.The authors bring together a wealth of information presenting a range of CAD algorithms and techniques for synthesizing and optimizing interconnect. Practical aspects of the algorithms and the models are explained with sufficient details. The book investigates the most effective parameters in layout optimization. Different post-layout optimization techniques with complexity analysis and benchmarks tests are provided. The impact crosstalk noise and coupling on the wire delay is analyzed. Parameters that affect signal integrity are also considered. Presents a range of CAD algorithms and techniques for synthesizing and optimizing interconnectProvides insight & intuition into layout analysis and optimization for interconnect in high speed, high complexity integrated circuits Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.