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Integrated Circuit Development Test by Kun Xia (2 results)
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Integrated Circuit Development and Test (Elementary)(Chinese Edition)
Language: English
Published by Higher Education Press, 2021
ISBN 10: 7040553260 ISBN 13: 9787040553260
paperback. Condition: New. Language:Chinese.Paperback.Pub Date:2021-01-01 Pages:232 Publisher:Higher Education Press This book is a supporting textbook for the 1+X vocational skill level certificate. corresponding to the integrated circuit development and testing vocational skill level certificate. covering the related primary certificate The field of work consists of 6 items: professional quality. wafer process. wafer testing. integrated circuit packaging. integrated circuit testing. and integrated circuit application.
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Integrated Circuit Development and Test (Elementary)(Chinese Edition)
Language: Chinese
Published by Higher Education Press, 2021
ISBN 10: 7040553260 ISBN 13: 9787040553260
paperback. Condition: New. Language:Chinese.Paperback.Pub Date:2021-01-01 Pages:232 Publisher:Higher Education Press This book is a supporting textbook for the 1+X vocational skill level certificate. corresponding to the integrated circuit development and testing vocational skill level certificate. covering the related primary certificate The field of work consists of 6 items: professional quality. wafer process. wafer testing. integrated circuit packaging. integrated circuit testing. and integrated circuit application.
