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Fundamentals Electromigration Aware Integrated Circuit by Lienig Jens (10 results)
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Paperback. Condition: New. New. book.
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Paperback. Condition: Brand New. reprint edition. 176 pages. 9.25x6.10x0.40 inches. In Stock.
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Fundamentals of Electromigration-Aware Integrated Circuit Design
Published by Springer Nature Switzerland, Springer Nature Switzerland Feb 2025, 2025
ISBN 10: 3031800222 ISBN 13: 9783031800221
Language: English
£ 123.03
Convert currency£ 12.01 shipping from Germany to United KingdomQuantity: 1 available
Add to basketBuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability.
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£ 157.27
Convert currency£ 6.55 shipping from U.S.A. to United KingdomQuantity: 4 available
Add to basketCondition: New. Second Edition 2025 NO-PA16APR2015-KAP.
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Fundamentals of Electromigration-Aware Integrated Circuit Design
Published by Springer International Publishing, 2018
ISBN 10: 3030088111 ISBN 13: 9783030088118
Language: English
£ 68.27
Convert currency£ 21.46 shipping from Germany to United KingdomQuantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Enables readers to understand and meet challenges of electromigration, including its effects on the reliability of electronic systemsAccessible to readers of varying backgrounds and experience levels, combining practical application with.
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Fundamentals of Electromigration-Aware Integrated Circuit Design
Published by Springer Verlag GmbH, 2025
ISBN 10: 3031800222 ISBN 13: 9783031800221
Language: English
£ 102.30
Convert currency£ 21.46 shipping from Germany to United KingdomQuantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt.
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Fundamentals of Electromigration-Aware Integrated Circuit Design
Published by Springer Nature Switzerland, Springer Nature Switzerland Feb 2025, 2025
ISBN 10: 3031800222 ISBN 13: 9783031800221
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
£ 123.03
Convert currency£ 9.45 shipping from Germany to United KingdomQuantity: 2 available
Add to basketBuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability. 184 pp. Englisch.
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Fundamentals of Electromigration-Aware Integrated Circuit Design
Published by Springer Nature Switzerland, Springer Nature Switzerland Feb 2025, 2025
ISBN 10: 3031800222 ISBN 13: 9783031800221
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
£ 123.03
Convert currency£ 30.06 shipping from Germany to United KingdomQuantity: 1 available
Add to basketBuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 184 pp. Englisch.
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Condition: New. Print on Demand.
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£ 179.48
Convert currency£ 6.83 shipping from Germany to United KingdomQuantity: 4 available
Add to basketCondition: New. PRINT ON DEMAND.
