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Fundamentals Atomic Force Microscopy by Ronald Reifenberger (38 results)
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paperback. Condition: Very Good. Fast Shipping - Safe and Secure 7 days a week!
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FUNDAMENTALS OF ATOMIC FORCE MICROSCOPY - PART I: FOUNDATIONS (Lessons from Nanoscience: A Lecture Notes)
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Comp, 2015
ISBN 10: 9814630349 ISBN 13: 9789814630344
Language: English
hardcover. Condition: Very Good. Fast Shipping - Safe and Secure 7 days a week!
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Fundamentals Of Atomic Force Microscopy - Part I: Foundations (Lessons from Nanoscience: A Lecture Notes)
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Company, 2015
ISBN 10: 9814630357 ISBN 13: 9789814630351
Language: English
Condition: new.
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Condition: Used. pp. 350.
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Condition: As New. Unread book in perfect condition.
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Condition: Used. pp. 350.
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Condition: Used. pp. 350.
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Fundamentals Of Atomic Force Microscopy - Part I: Foundations (Paperback)
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Co Pte Ltd, Singapore, 2015
ISBN 10: 9814630357 ISBN 13: 9789814630351
Language: English
Paperback. Condition: new. Paperback. The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to "Fundamentals of AFM", an online video course available at for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos) The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Fundamentals of Atomic Force Microscopy : Foundations
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Fundamentals of Atomic Force Microscopy : Foundations
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
-
Fundamentals of Atomic Force Microscopy: Part I: Foundations
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Company, 2015
ISBN 10: 9814630349 ISBN 13: 9789814630344
Language: English
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
-
Fundamentals of Atomic Force Microscopy: Part I: Foundations
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Company, 2015
ISBN 10: 9814630349 ISBN 13: 9789814630344
Language: English
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
-
Fundamentals of Atomic Force Microscopy: Part I: Foundations
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Pub Co Inc, 2015
ISBN 10: 9814630357 ISBN 13: 9789814630351
Language: English
Paperback. Condition: Brand New. 350 pages. 10.50x7.50x1.00 inches. In Stock.
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FUNDAMENTALS OF ATOMIC FORCE MICROSCOPY - PART I: FOUNDATIONS (Lessons from Nanoscience: A Lecture Notes)
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Company, 2015
ISBN 10: 9814630349 ISBN 13: 9789814630344
Language: English
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
-
Fundamentals of Atomic Force Microscopy: Foundations
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Company, 2015
ISBN 10: 9814630349 ISBN 13: 9789814630344
Language: English
Condition: New. 350.
-
Fundamentals of Atomic Force Microscopy : Foundations
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Company, 2015
ISBN 10: 9814630349 ISBN 13: 9789814630344
Language: English
Condition: New.
-
Fundamentals of Atomic Force Microscopy: Foundations
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Company, 2015
ISBN 10: 9814630349 ISBN 13: 9789814630344
Language: English
Condition: New. 350.
-
FUNDAMENTALS OF ATOMIC FORCE MICROSCOPY - PART I: FOUNDATIONS (Lessons from Nanoscience: A Lecture Notes)
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Company, 2015
ISBN 10: 9814630349 ISBN 13: 9789814630344
Language: English
Condition: New.
-
Fundamentals of Atomic Force Microscopy: Foundations
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Company, 2015
ISBN 10: 9814630349 ISBN 13: 9789814630344
Language: English
Condition: New. 350.
-
Fundamentals Of Atomic Force Microscopy - Part I: Foundations (Paperback)
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Co Pte Ltd, Singapore, 2015
ISBN 10: 9814630357 ISBN 13: 9789814630351
Language: English
Paperback. Condition: new. Paperback. The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to "Fundamentals of AFM", an online video course available at for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos) The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
-
FUNDAMENTALS OF ATOMIC FORCE MICROSCOPY - PART I: FOUNDATIONS (Lessons from Nanoscience: A Lecture Notes)
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Company, 2015
ISBN 10: 9814630349 ISBN 13: 9789814630344
Language: English
Condition: New.
-
Fundamentals of Atomic Force Microscopy : Foundations
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Company, 2015
ISBN 10: 9814630349 ISBN 13: 9789814630344
Language: English
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Fundamentals Of Atomic Force Microscopy - Part I: Foundations (Hardcover)
Book 4 of 9: Lessons From Nanoscience: A Lecture NotesPublished by World Scientific Publishing Co Pte Ltd, Singapore, 2015
ISBN 10: 9814630349 ISBN 13: 9789814630344
Language: English
Hardcover. Condition: new. Hardcover. The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to "Fundamentals of AFM", an online video course available at for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos) The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
