Failure Analysis Mechanisms Techniques Photo by Devaney John (7 results)

Hardcover. Condition: Very Good. Second Printing 1986. The hardcover of "Failure Analysis Mechanisms, Techniques, & Photo Atlas" is in good condition, with no dust jacket present. The binding is firm, and the cover shows minimal signs of wear. There are no inscriptions or library markings, making it a clean copy for collectors or professionals. The pages are intact and free from significant marks or annotations. unknown (no dust jacket visible).…

Hardcover. Condition: Very Good. Dust Jacket Condition: Fair. The book has faint edge wear, minor overall fading/browning, and some smudging on the textblock. Otherwise, it is unmarked, tightly-bound, and clean. The dust jacket is in poor condition. There are significant tears along the edges, including a long tear taped up on the back cover. There is also rubbing, and overall fading. Otherwise, it is still intact and has all the information visible. It is also now adorned with mylar. …

Hardcover. Condition: Near fine. Near fine. First Edition. Step-by-step guide to performing failure analysis on electrical components and integrated circuits, including verifying the failure, determining the mode of failure and the physical cause, and suggesting corrective action. Provides detailed descriptions of procedural methods, laboratory methods and techniques, and failure modes and mechanisms. Inscribed by Devaney on the front pastedown. Tiny chip to the rear panel of the dust jacket; otherwise a near fine copy. Signed by Author.…

Hardcover. Condition: Good. Hardcover; fading and shelf wear to exterior; stamping on lower outside edg e of pages; otherwise contents in good condition with clean text, firm bind ing.

Hardcover. Condition: Very Good. Dust Jacket Condition: Very Good. First. Black faux leather binding with gold stamping on cover and spine. Color photo DJ. Near fine condition for both.

Hardcover. Dust Jacket Included. First Edition. Hardback, 1st Edition, Fine in near VG DJ; ( several closed tears near jacket edges, chipping to corners and spine ends). Warmly inscribed by John Devaney (one of the authors) presenting book to " one of the pros" of the failure analysis field plus laid-in author dated and signed note. 4to., 400+ pages; A comprehensive look at failure analysis by three experts in the field who have distilled their life's work into this book. Illustrated with photos and diagrams., 0.0 0.0 0.0. Signed by Author.…

hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.