Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
Condition: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
Hardcover. Condition: New. ISBN:9788126568512,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition.
Hardcover. Condition: Very Good. Book has light shelf wear, otherwise this is an excellent copy, book has great binding, clean pages, no major defects.
Condition: New.
Condition: New. Well packaged and promptly shipped from California. Partnered with Friends of the Library since 2010.
Condition: New.
Condition: New. In.
Condition: As New. Unread book in perfect condition.
Condition: As New. Unread book in perfect condition.
Published by John Wiley & Sons Inc, 2009
ISBN 10: 0470511370 ISBN 13: 9780470511374
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Hardback. Condition: New. New copy - Usually dispatched within 4 working days. 848.
Published by John Wiley & Sons Inc, 2009
ISBN 10: 0470511370 ISBN 13: 9780470511374
Language: English
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
First Edition
Condition: New. Provides a comprehensive analysis of ESD failure mechanisms over a wide range of semiconductor materials, devices, circuits and applications. Sets out methods for eliminating failure mechanisms through workable circuit solutions, including practical examples of failure defects. Num Pages: 408 pages, Illustrations. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 252 x 176 x 27. Weight in Grams: 818. . 2009. 1st Edition. Hardcover. . . . .
Condition: New. Brand new! Please provide a physical shipping address.
Published by John Wiley & Sons Inc, 2009
ISBN 10: 0470511370 ISBN 13: 9780470511374
Language: English
Seller: Kennys Bookstore, Olney, MD, U.S.A.
Condition: New. Provides a comprehensive analysis of ESD failure mechanisms over a wide range of semiconductor materials, devices, circuits and applications. Sets out methods for eliminating failure mechanisms through workable circuit solutions, including practical examples of failure defects. Num Pages: 408 pages, Illustrations. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 252 x 176 x 27. Weight in Grams: 818. . 2009. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
Buch. Condition: Neu. Neuware - Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics.
Published by John Wiley & Sons Inc, 2009
ISBN 10: 0470511370 ISBN 13: 9780470511374
Language: English
Seller: Revaluation Books, Exeter, United Kingdom
Hardcover. Condition: Brand New. 1st edition. 408 pages. 9.84x6.85x1.10 inches. In Stock. This item is printed on demand.