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Defect Recognition Image Processing by Doneker Rechenberg (3 results)
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Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, . 1997 (Institute of Physics Conference)
Language: English
Published by CRC Press 1998-01-01, 1998
ISBN 10: 0750305002 ISBN 13: 9780750305006
Hardcover. Condition: New.
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Defect Recognition and Image Processing in Semiconductors 1997
Language: English
Published by Taylor & Francis Group, 1998
ISBN 10: 0750305002 ISBN 13: 9780750305006
Condition: New. pp. 548.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Doneker, J.Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This .
