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Defect Recognition Image Processing by Doneker (9 results)
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Defect Recognition and Image Processing in Semiconductors 1997
Language: English
Published by Taylor & Francis Group, 1998
ISBN 10: 0750305002 ISBN 13: 9780750305006
Condition: New. pp. 548.
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Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, ... 1997 (Institute of Physics Conference Series)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 330.88
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, . 1997 (Institute of Physics Conference)
Language: English
Published by CRC Press 1998-01-01, 1998
ISBN 10: 0750305002 ISBN 13: 9780750305006
Hardcover. Condition: New.
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Defect Recognition and Image Processing in Semiconductors 1997
Language: English
Published by Taylor & Francis Group, 1998
ISBN 10: 0750305002 ISBN 13: 9780750305006
Condition: New. pp. 548.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Doneker, J.Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This .
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Defect Recognition and Image Processing in Semiconductors 1997
Language: English
Published by Taylor & Francis Group, 1998
ISBN 10: 0750305002 ISBN 13: 9780750305006
Condition: New. pp. 548 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam This item is printed on demand.
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Defect Recognition and Image Processing in Semiconductors 1997
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 4 out of 5 stars
£ 336.82
£ 6.76 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHRD. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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HRD. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.
