Defect Recognition Image Processing (17 results)
Published by Institute of Physics, 1998
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Add to basketHardcover. Condition: Very Good. Professional book dealer with storefront since 1975. All orders are processed promptly and carefully packaged. ; 524 pages.
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paperback. Condition: New. Language:Chinese.Paperback. Pub Date: 2024-02 Pages: 191 Publisher: Wuhan University Press This book addresses the practical problems and needs encountered in the radiographic inspection of welds in important fields such as nuclear power. chemical industry. and shipbuilding. Using digitized radiographi…c images of weld seams as the research object. it solves problems such as automatic defect identification. image enhancement based on human vision. digital storage and retrieval of radiographic .
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Condition: Good. *Price HAS BEEN REDUCED by 10% until Monday, Aug. 24 (weekend SALE item) 320 pp., hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additiona…l duties, taxes, or fees required by recipient's country. Photos available upon request.
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Condition: Very Good. *Price HAS BEEN REDUCED by 10% until Monday, Aug. 24 (weekend SALE item) hardcover, 306 pp., ex library, but text and binding still clean and tight . - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible f…or any additional duties, taxes, or fees required by recipient's country. Photos available upon request.
Defect Recognition and Image Processing in Semiconductors 1997 : Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (Drip Vii) Held in Templin, Germany, 7-10
International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany); Donecker, J.; Rechenberg, I.
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Defect Recognition and Image Processing in Semiconductors 1997 : Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (Drip Vii) Held in Templin, Germany, 7-10
International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany); Donecker, J.; Rechenberg, I.
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Defect Recognition and Image Processing in Semiconductors 1997 : Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (Drip Vii) Held in Templin, Germany, 7-10
International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany); Donecker, J.; Rechenberg, I.
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Defect Recognition and Image Processing in Semiconductors 1997 : Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (Drip Vii) Held in Templin, Germany, 7-10
International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany); Donecker, J.; Rechenberg, I.
- Hardcover
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Hardcover. Condition: Brand New. 1st edition. 524 pages. 9.75x6.50x1.25 inches. In Stock.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Doneker, J.Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomog…eneities in complete silicon wafers. This .
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HRD. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Condition: New. pp. 548 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam This item is printed on demand.
