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Defect Analysis Electron Microscopy (2 results)
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Defect analysis in electron microscopy
Language: English
Published by Wiley : distributed by Halstead Press, 1975
ISBN 10: 0412137704 ISBN 13: 9780412137709
Paperback. Condition: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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Condition: acceptable. This book is in Acceptable condition. All pages are intact, but may have lots of notes, water damage or other issues and be ex library.
