Computed Electron Micrographs Defect by Head a K (4 results)
Computed Electron Micrographs and Defect Identification (Defects in Crystalline Solids)
A K Head, P Humble, L M Clarebrough, A J Morton and C T Forwood
- Hardcover
Seller: MB Books, Derbyshire, United KingdomMB Books
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£ 14.00
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Hardcover. Condition: Good. No Jacket. Condition : Good. Hard cover, no jacket. Former university library copy with associated markings. 400pp. No annotations or highlighting. Covered in protective laminate. Minor shelf wear. Photo on request.
- Hardcover
- First Edition
Seller: Webbooks, Wigtown, Wigtown, United KingdomWebbooks, Wigtown
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Condition: Used - Good
£ 8.00
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Hard Cover. Condition: Good. No Jacket. First edition. From an academic library with the usual stamps etc.
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
£ 75.07
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Paperback. Condition: Brand New. 412 pages. 9.00x6.00x0.93 inches. In Stock.
Computed electron micrographs and defect identification.
Head, A. K., P. Humble, L. M. Clarebrough, A. J. Morton and C. T. Forwood.
Published by Amsterdam, North-Holland Publ. Comp. 1973., 1973
- Hardcover
Seller: Antiquariat Löcker, Wien, AustriaAntiquariat Löcker
Contact seller5-star sellerCondition: Used
£ 25.19
£ 42.16 shippingShips from Austria to U.S.A.Quantity: 1 available
Add to basketIn Englisch. gr.-8°, 400 S., mit zahlr. Textabb., OLn. m. Klarsichtfolien-Überzug, guter Zustand, ausgeschied. Bibl.-Expl. mit den üblichen Kennzeichnungen. ISBN 0-720417570.
