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Atomic Force Microscopy Imaging Measuring by Bellitto (8 results)
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
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International EditionCondition: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 111.35
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Ships from United Kingdom to U.S.A.Quantity: Over 20 available
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Atomic Force Microscopy Imaging Measuring and Manipulating Surfaces at the Atomic Scale
Language: English
Published by Intech, 2016
Hardcover. Condition: New. ISBN:9789535104148.
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Buch. Condition: Neu. Atomic Force Microscopy | Imaging, Measuring and Manipulating Surfaces at the Atomic Scale | Victor Bellitto | Buch | 270 S. | Englisch | 2012 | IntechOpen | EAN 9789535104148 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu Print on Demand.
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Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.
