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Advanced Semiconductor Processing Characterization (2 results)
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Advanced Semiconductor Processing and Characterization of Electronic and Optical Materials: Volume 463, Proceedings; 24-25 January 1984, Los Angeles, California, SPIE.
Published by SPIE PRESS-The International Society for Optical Engineering, Bellingham, WA, U.S.A., 1984
ISBN 10: 0892524987 ISBN 13: 9780892524983
Language: English
First Edition
Paperback. Condition: Good. No Jacket. 1st. W/full markings, pocket, and/or bookplate. A few loose pages but complete. Size: 4to. Ex-Library.
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Advanced Semiconductor Processing and Characterization of Electronic and Optical Materials: January 24-25, 1984, Los Angeles, California [Proceedings of SPIE - The International Society for Optical Engineering, Volume 463]
Published by SPIE (The International Society for Optical Engineering), Bellingham, WA., 1984
ISBN 10: 0892524987 ISBN 13: 9780892524983
Language: English
Paperback. Condition: Very Good. 4to, paperback. Vg condition. Ex-lib copy w/ light markings to opening pgs, crossed-out stamps on text-block edges, cover label removed; contents bright & clean, binding tight. vi, 147 p. Cooperating organizations, American Vacuum Society, Electronic Materials and Process Division.
