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9781475784749 - High Performance Memory Testing: Design Principles, Fault Modeling and Self-test: 22a Frontiers in Electronic Testing, 22a by Adams, R Dean (11 results)
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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)
Book 12 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 136.79
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Taschenbuch. Condition: Neu. High Performance Memory Testing | Design Principles, Fault Modeling and Self-Test | R. Dean Adams | Taschenbuch | xiv | Englisch | 2013 | Springer | EAN 9781475784749 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Condition: New. pp. 266.
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High Performance Memory Testing : Design Principles, Fault Modeling and Self-Test
Book 12 of 40: Frontiers in Electronic TestingLanguage: English
Published by Springer US, Springer, 2013
ISBN 10: 1475784740 ISBN 13: 9781475784749
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: new. Questo è un articolo print on demand.
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High Performance Memory Testing
Book 12 of 40: Frontiers in Electronic TestingLanguage: English
Published by Springer US Apr 2013, 2013
ISBN 10: 1475784740 ISBN 13: 9781475784749
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. 264 pp. Englisch.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were.
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High Performance Memory Testing
Book 12 of 40: Frontiers in Electronic TestingLanguage: English
Published by Springer US, Springer Apr 2013, 2013
ISBN 10: 1475784740 ISBN 13: 9781475784749
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 264 pp. Englisch.
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Condition: New. Print on Demand pp. 266 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Condition: New. PRINT ON DEMAND pp. 266.
