9781441923080 - Transmission Electron Microscopy: Physics of Image Formation: 36 Springer Series in Optical Sciences, 36 by Reimer, Ludwig; Kohl, Helmut (10 results)

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Taschenbuch. Condition: Neu. Transmission Electron Microscopy | Physics of Image Formation | Ludwig Reimer (u. a.) | Taschenbuch | xvi | Englisch | 2010 | Springer New York | EAN 9781441923080 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Condition: New. This text, the standard of the field, includes an overview of such topics as the theory of image and contrast formation as well as discussion of recent progress in the field, especially in the areas of aberration corrector and energy filtering. Series: Springer Series in Optical Sciences. Num Pages: 606 pages, 276 black & white illustrations, 21 black & white tables, biography. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 232 x 157 x 32. Weight in Grams: 828. . 2010. 5th ed. Softcover of orig. ed. 2008. Paperback. . . . .

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The aim of this monograph is to outline the physics of image formation, electron-specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.

Condition: New. This text, the standard of the field, includes an overview of such topics as the theory of image and contrast formation as well as discussion of recent progress in the field, especially in the areas of aberration corrector and energy filtering. Series: Springer Series in Optical Sciences. Num Pages: 606 pages, 276 black & white illustrations, 21 black & white tables, biography. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 232 x 157 x 32. Weight in Grams: 828. . 2010. 5th ed. Softcover of orig. ed. 2008. Paperback. . . . . Books ship from the US and Ireland.

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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Standard reference bookNow updated by the successor of the original authorNew topics of the field includedGives a comprehensive review of recent progresses in TEMThe aim of this monograph is to outline the physics of image fo.

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The aim of this monograph is to outline the physics of image formation, electron-specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics. 590 pp. Englisch.