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9780387259024 - Dynamic Characterisation of Analogue-to-digital Converters: 860 the Springer International Series in Engineering and Computer Science, 860 (13 results)
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Condition: New. pp. 304.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: New. pp. 304 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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Condition: New. pp. 304.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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International EditionCondition: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-12 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 280 | Sprache: Englisch | Produktart: Bücher | The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system's performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain.Dynamic Characterisation of Analogue-to-Digital Converters presents a state of the art overview of the methods and procedures employed for characterising ADCs' dynamic performance behaviour using sinusoidal stimuli. The three classical methods - histogram, sine wave fitting, and spectral analysis - are thoroughly described, and new approaches are proposed to circumvent some of their limitations.This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the most important and critical details for their implementation.
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Dynamic Characterisation of Analogue-to-Digital Converters (The Springer International Series in Engineering and Computer Science, 860)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 136.79
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Gebunden. Condition: New. Practical overview of Analog-to-Digital ConvertersPractical overview of Analog-to-Digital ConvertersIncludes supplementary material: sn.pub/extrasDallet, Dominique obtained his PhD degree in Electrical Engineer.
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Dynamic Characterisation of Analogue-To-Digital Converters
Language: English
Published by Springer Us Nov 2005, 2005
ISBN 10: 0387259023 ISBN 13: 9780387259024
Buch. Condition: Neu. Neuware - The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system's performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain.Dynamic Characterisation of Analogue-to-Digital Converters presents a state of the art overview of the methods and procedures employed for characterising ADCs' dynamic performance behaviour using sinusoidal stimuli. The three classical methods - histogram, sine wave fitting, and spectral analysis - are thoroughly described, and new approaches are proposed to circumvent some of their limitations.This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the most important and critical details for their implementation.
