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Wang Shengkai Wang Xiaolei (25 results)
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Mos Interface Physics, Process and Characterization
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MOS Interface Physics, Process and Characterization
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£ 58.37
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Add to basketCondition: New. pages cm First edition Includes bibliographical references.
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Mos Interface Physics, Process and Characterization
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MOS Interface Physics, Process and Characterization
Published by CRC Press 2021-10-05, 2021
ISBN 10: 1032106271 ISBN 13: 9781032106274
Language: English
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MOS Interface Physics, Process and Characterization
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MOS Interface Physics, Process and Characterization 1st Edition
Published by H N H International Limited, 2021
ISBN 10: 1032106271 ISBN 13: 9781032106274
Language: English
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MOS Interface Physics, Process and Characterization
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MOS Interface Physics, Process and Characterization
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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MOS Interface Physics, Process and Characterization 1st Edition
Published by H N H International Limited, 2021
ISBN 10: 1032106271 ISBN 13: 9781032106274
Language: English
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MOS Interface Physics, Process and Characterization 1st Edition
Published by H N H International Limited, 2021
ISBN 10: 1032106271 ISBN 13: 9781032106274
Language: English
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Hardcover. Condition: Brand New. 161 pages. 9.00x6.00x0.75 inches. In Stock.
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Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Shengkai Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the University of Tokyo in 2011 and has been engaged in Ge, III-V, SiC in MOS technology. He has published more than 1.
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£ 91.74
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Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Shengkai Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the University of Tokyo in 2011 and has been engaged in Ge, III-V, SiC in MOS technology. He has published more than 1.
