Published by Beijing Institute of Technology Press, 2019
ISBN 10: 7568268284 ISBN 13: 9787568268288
Language: Chinese
Seller: liu xing, Nanjing, JS, China
£ 94.77
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Add to basketpaperback. Condition: New. Language:Chinese.Paperback. Pub Date: 2019-03-01 Pages: 351 Publisher: Beijing Institute of Technology Press book comprehensive and systematic introduction to the effect of charge-discharge test satellite technology. the main contents are: charge-discharge test methods for material characterization of effects. including two secondary electron emission coefficient. optoelectronics. intrinsic conductivity. radiation-induced conductivity. dielectric constant and dielectric strength; discharge su.