Schafft Harry Electronic Technology Division (1 results)

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Semiconductor Measurement Technology : ARPA/NBS Workshop II. Hermeticity Testing for Integrated Circuits (NBS Special Publication 400-9).
Schafft, Harry A. and the Electronic Technology Division, Institute for Applied Technology, National Bureau of Standards.
Published by National Bureau of Standards., 1974
- Softcover
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Soft cover. Condition: Very Good. ORIGINAL 1974 PUBLICATION; Softcover; in very good condition. Book.