Mulvey Sheppard (3 results)
More imagesLanguage: English
Published by London & San Diego : Academic Press, 1991
- Hardcover
Seller: avelibro OHG, Dinkelscherben, Germanyavelibro OHG
Contact seller5-star sellerAssociation member: BOEV
Condition: Used - Very good
£ 24.73
£ 8.58 shippingShips from Germany to U.S.A.Quantity: 1 available
Add to basket23,5 x 15,5 cm. Condition: Gut. Volume 12. XII, 363 Pages ; With Figures Original Hardcover (Pappband) mit Bibliotheksrückenschild im sehr guten Zustand, innen mit Bibliotheksstempeln. Englische Sprache. - Original Hardboard with Library label on back in very good condition, inside with Library stamps. English Language B14-02-01…G|S80 Sprache: Englisch Gewicht in Gramm: 690.
More imagesLanguage: English
Published by London & San Diego : Academic Press, 1989
- Hardcover
Seller: avelibro OHG, Dinkelscherben, Germanyavelibro OHG
Contact seller5-star sellerAssociation member: BOEV
Condition: Used - Very good
£ 24.73
£ 8.58 shippingShips from Germany to U.S.A.Quantity: 1 available
Add to basket23,5 x 15,5 cm. Condition: Gut. Volume 11. XI, 185 Pages ; With Figures Original Hardcover (Pappband) mit Bibliotheksrückenschild im sehr guten Zustand, innen mit Bibliotheksstempeln. Englische Sprache. - Original Hardboard with Library label on back in very good condition, inside with Library stamps. English Language B12-02-01B…|S78 Sprache: Englisch Gewicht in Gramm: 458.
- Hardcover
- First Edition
Seller: Antiquariat Smock, Freiburg, GermanyAntiquariat Smock
Contact seller5-star sellerCondition: Used - Very good
£ 35.33
£ 29.33 shippingShips from Germany to U.S.A.Quantity: 1 available
Condition: Gut. Formateinband: Pappband / gebundene Ausgabe XII, 363 S. (24 cm) 1st Edition; (With many figures); Sauberes Exemplar aus Institutsbibliothek mit den üblichen Schildchen und Stempeln; sonst tadellos. Sprache: Englisch Gewicht in Gramm: 800 [Stichwörter: Invention of the Electron Fresnel Interference Biprism, Electr…on Image Plane Off-axis Holography of Atomic Structures, Magnetic Through-the-lens detection in electron microscopy and spectroscopy, Advances in voltage-contrast detectors in scanning electron microscopes, Scanning Near-field optical microscopy (SNOM), Microscopic thermal wave non-destructive testing].
