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Hardcover. Condition: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Testing and Reliable Design of CMOS Circuits (The Kluwer International Series in Engineering and Computer Science, 88)
Language: English
Published by Kluwer Academic Publishers, 1990
ISBN 10: 0792390563 ISBN 13: 9780792390565
Hardcover. Condition: Very Good. This book has mild rubbing and surface scratching to both covers, light smudging to both covers most notable at the back cover, and faint smudging to the edges of the textblock, otherwise this book is in very good condition with crisp, unmarked pages, a tight binding, and a strong, glossy cover.
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Condition: very_good. This books is in Very good condition. There may be a few flaws like shelf wear and some light wear.
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Testing and Reliable Design of CMOS Circuits
Language: English
Published by Kluwer Academic Publishers, Boston, 1990
ISBN 10: 0792390563 ISBN 13: 9780792390565
Seller: PsychoBabel & Skoob Books, Didcot, United Kingdom
Seller rating 5 out of 5 stars
hardcover. Condition: Very Good. Dust Jacket Condition: No Dust Jacket. Name from previous owner on FEP. No dust jacket. Binding is very well preserved, though with light surface wear to covers. Pages are clean and crisp, and printing is tight, clean and bright throughout. MB. Used.
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Testing and Reliable Design of CMOS Circuits
Language: English
Published by Kluwer Academic Publishers, Boston, MA, U. S. A., 1990
ISBN 10: 0792390563 ISBN 13: 9780792390565
Seller: PsychoBabel & Skoob Books, Didcot, United Kingdom
Seller rating 5 out of 5 stars
First Edition
hardcover. Condition: Very Good. Dust Jacket Condition: No Dust Jacket. First Edition. Printed boards, no jacket. Exterior a little worn, grubby; previous owner's name on FEP; contents otherwise clean, sound, bright. TPW. Used.
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Testing and Reliable Design of CMOS Circuits
Language: English
Published by Kluwer Academic Publishers, Boston, 1990
ISBN 10: 0792390563 ISBN 13: 9780792390565
First Edition
Hardcover. Condition: Very Good. Dust Jacket Condition: No Dj. First Edition. Owner's name is signed.
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How to write a Dissertation? An example with its merits & demerits: A Cross-Sectional survey of Chronic Kidney Disease in a Tertiary Care Hospital in Eastern Region of India
Language: English
Published by LAP LAMBERT Academic Publishing, 2017
ISBN 10: 6202021780 ISBN 13: 9786202021784
Paperback. Condition: Brand New. 100 pages. 8.66x5.91x0.23 inches. In Stock.
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Nanoscale CMOS VLSI Circuits: Design for Manufacturability
Language: English
Published by The McGraw-Hill Company, 2010
ISBN 10: 007163519X ISBN 13: 9780071635196
Condition: New. pp. xv + 296.
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Nanoscale CMOS VLSI Circuits: Design for Manufacturability
Language: English
Published by The McGraw-Hill Company, 2010
ISBN 10: 007163519X ISBN 13: 9780071635196
Condition: New. pp. xv + 296 Illus.
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Nanoscale CMOS VLSI Circuits: Design for Manufacturability
Language: English
Published by The McGraw-Hill Company, 2010
ISBN 10: 007163519X ISBN 13: 9780071635196
Condition: New. pp. xv + 296.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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How to write a Dissertation? An example with its merits & demerits | A Cross-Sectional survey of Chronic Kidney Disease in a Tertiary Care Hospital in Eastern Region of India
Language: English
Published by LAP LAMBERT Academic Publishing, 2017
ISBN 10: 6202021780 ISBN 13: 9786202021784
Taschenbuch. Condition: Neu. How to write a Dissertation? An example with its merits & demerits | A Cross-Sectional survey of Chronic Kidney Disease in a Tertiary Care Hospital in Eastern Region of India | Sandip Kumar Kundu | Taschenbuch | 100 S. | Englisch | 2017 | LAP LAMBERT Academic Publishing | EAN 9786202021784 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 260 | Sprache: Englisch | Produktart: Bücher | In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.
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Condition: As New. Unread book in perfect condition.
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Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 136.79
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Ships from United Kingdom to U.S.A.Quantity: Over 20 available
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Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science, 88)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 136.79
£ 11.98 shipping
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Testing and Reliable Design of Cmos Circuits
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 136.78
£ 15 shipping
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Condition: New.
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Condition: As New. Unread book in perfect condition.
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Condition: New.
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Condition: New.
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Nanoscale CMOS VLSI Circuits : Design for Manufacturability
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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£ 149.36
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Condition: New. pp. 248.
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Testing and Reliable Design of Cmos Circuits
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 152.54
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Nanoscale CMOS VLSI Circuits : Design for Manufacturability
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 167.35
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Nanoscale CMOS VLSI Circuits: Design for Manufacturability
Language: English
Published by McGraw-Hill Professional, 2010
ISBN 10: 007163519X ISBN 13: 9780071635196
Condition: New. Cutting-edge Design for Manufacturability Techniques for Nanoscale CMOS VLSI CircuitsCutting-edge Design for Manufacturability Techniques for Nanoscale CMOS VLSI Circuits Covering defect analysis, equipment, and lithographic control evaluations, t.
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Condition: New.
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Testing and Reliable Design of CMOS Circuits
Language: English
Published by Springer US, Springer New York, 2011
ISBN 10: 1461288185 ISBN 13: 9781461288183
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.
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Paperback. Condition: Like New. Like New. book.
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Nanoscale CMOS VLSI Circuits: Design for Manufacturability
Language: English
Published by Mcgraw Hill LLC Jul 2010, 2010
ISBN 10: 007163519X ISBN 13: 9780071635196
Buch. Condition: Neu. Neuware - Cutting-edge Design for Manufacturability Techniques for Nanoscale CMOS VLSI Circuits Covering defect analysis, equipment, and lithographic control evaluations, this book offers a holistic approach for VLSI circuit designers to evaluate and analyze IC circuit designs from the manufacturability point of view. This practical guide is ideal for design engineers, managers, students, and academics interested in understanding the sources of semiconductor chip failures and how these problems can be mitigated through design.
