Devaney John Leedy Keery (1 results)

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Semiconductor Measurement Technology: Notes on SEM Examination of Microelectronic Devices (NBS Special Publication 400-35).
Devaney, John R., K. O. Leedy and W. J. Keery.
Published by National Bureau of Standards., 1977
- Softcover
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Soft cover. Condition: Very Good. ORIGINAL PUBLICATION; Softcover; in very good condition. Book.