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Chakrabarty Krishnendu Goel Sandeep (29 results)
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Condition: New.
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£ 94.36
Convert currency£ 6.50 shipping from United Kingdom to U.S.A.Quantity: 3 available
Add to basketCondition: New. pp. 259.
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Condition: New.
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Condition: New. pp. 259.
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Condition: As New. Unread book in perfect condition.
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.38
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Add to basketCondition: New. In.
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Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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£ 95.35
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Published by Taylor & Francis Ltd, 2017
ISBN 10: 1138075779 ISBN 13: 9781138075771
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
£ 95.36
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Add to basketPaperback / softback. Condition: New. New copy - Usually dispatched within 4 working days. 539.
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£ 108.86
Convert currency£ 8.63 shipping from Germany to U.S.A.Quantity: 3 available
Add to basketCondition: New. pp. 259.
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Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 108.34
Convert currency£ 15 shipping from United Kingdom to U.S.A.Quantity: 10 available
Add to basketCondition: As New. Unread book in perfect condition.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Published by Taylor & Francis Group, 2013
ISBN 10: 1439829411 ISBN 13: 9781439829417
Language: English
Condition: New. pp. 250 2nd Edition.
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Published by Taylor & Francis Group, 2013
ISBN 10: 1439829411 ISBN 13: 9781439829417
Language: English
£ 161.25
Convert currency£ 8.63 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: New. pp. 250.
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Condition: New.
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
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Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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£ 194.99
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Published by Taylor and Francis Inc, 2013
ISBN 10: 1439829411 ISBN 13: 9781439829417
Language: English
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
£ 204.38
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£ 187
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Add to basketHardcover. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 204.37
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Add to basketCondition: New.
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£ 220.34
Convert currency£ 42.50 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: New. Sandeep Kumar Goel is a Senior Manager (DFT/3D-Test) with Taiwan Semiconductor Manufacturing Company (TSMC), San Jose, CA. He received his Ph.D. degree from the University of Twente, The Netherlands. Prior to TSMC, he was in various rese.
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£ 241.28
Convert currency£ 25 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Brand New. 1st edition. 250 pages. 9.49x6.10x0.87 inches. In Stock.
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International Edition£ 295.85
Convert currencyFree shipping from United Kingdom to U.S.A.Quantity: 3 available
Add to basketHardcover. Condition: New. Brand New ! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Published by Taylor & Francis Inc Okt 2013, 2013
ISBN 10: 1439829411 ISBN 13: 9781439829417
Language: English
£ 269.08
Convert currency£ 54.65 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketBuch. Condition: Neu. Neuware - Advances in design methods and process technologies are causing a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variation, power supply, noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DiM)-related rule violations. The book also addresses small-delay defects (SDDs) and testing, which can cause immediate failures if introduced on both critical and non-critical paths in the circuit.
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PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
£ 101.01
Convert currency£ 5.02 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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£ 112.29
Convert currency£ 42.50 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Sandeep Kumar Goel is a Senior Manager (DFT/3D-Test) with Taiwan Semiconductor Manufacturing Company (TSMC), San Jose, CA. He received his Ph.D. degree from the University of Twente, The Netherlands. Prior to TSMC, he was in various rese.
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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Published by Taylor & Francis Group, 2013
ISBN 10: 1439829411 ISBN 13: 9781439829417
Language: English
£ 155.06
Convert currency£ 6.50 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: New. pp. 250 This item is printed on demand.
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£ 112.61
Convert currency£ 53.81 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketTaschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Advances in design methods and process technologies are leading to a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause timing failures on both critical and non-critical paths in the circuit.
