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Beddow John Keith (30 results)
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Particle Characterization in Technology: Volume II: Morphological Analysis
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Very Good. *Price HAS BEEN REDUCED by 10% until Monday, Feb. 16 (Sale item)* 265 pp., hardcover, minor library markings else text clean & binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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Particle Characterization in Technology, Vol. 2: Morphological Analysis
Seller: Phatpocket Limited, Waltham Abbey, HERTS, United Kingdom
Seller rating 5 out of 5 stars
Condition: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
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Hardcover. Condition: UsedGood. Hardcover; Fine Particle Science and Technology Series; surplus library copy with the usual stampings; reference number affixed to the spine; light fading, light shelf wear to exterior; in good condition with clean text and tight binding.
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Paperback. Condition: Very Good. Very Good. Lightly used, may have publisher's or previous owner's markings but NO markings in text. Pasadena's finest new and used bookstore.
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Particulate Science and Technology
Language: English
Published by Chemical Publishing Co., Inc., New York:, 1980
ISBN 10: 082060254X ISBN 13: 9780820602547
First Edition
Hardcover. Condition: Very Good condition. Dust Jacket Condition: No jacket. First Edition. New York:: Chemical Publishing Co., Inc., 1980. A solid reading/reference copy. Cover has light wear/rubbing to corners and spine ends. Inner hinges are perfectly sound. WITHDRAWN stamp, and a few other library markings. Pages are clean. NO underlining. NO highlighting. NO margin notes. Illustrated with many figures and a few highly magnified photographs. Numerous tables. Graphs. Contains a Preface, Introduction, and eight major sections, as follows: 1) In the scheme of things; 2) The single particle; 3) The formation and production of particulates; 4) The processing and handling of particulate matter; 5) Description of particulate assemblies; 6) Fine particle characterization; 7) Physical-chemical properties; 8) Hazards. Bibliographical references. Author Index. Subject Index. Bound in the original maroon boards, lettered in shiny gold on the spine and front cover. First Edition. Hard Cover. Very Good condition./No jacket. 8vo. xviii, 725pp. [743 total pages].
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Hardcover. Condition: Très bon. Ancien livre de bibliothèque. Couverture différente. Edition 1984. Tome 2. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Different cover. Edition 1984. Volume 2. Ammareal gives back up to 15% of this item's net price to charity organizations.
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Particle Characterization in Technology: Vol. 1: Applications and Microanalysis (CRC series on fine particle science and technology)
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. *Price HAS BEEN REDUCED by 10% until Monday, Feb. 16 (Sale item)* volume one, 246 pp., hardcover, ex library, else text and binding clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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Advanced Particulate Morphology
Language: English
Published by CRC Press, Inc. Boca Raton, FL 1977, 1980
ISBN 10: 0849357810 ISBN 13: 9780849357817
Seller: Bear Bookshop, John Greenberg, Brattleboro, VT, U.S.A.
Seller rating 4 out of 5 stars
187pp. 8vo Illustrated in black and white Black cloth of Fine Particle Science and Technology Series. Contributions by Robert Ehrlich, P Jeffrey Brown, Jeffrey M Yarus, Duante T Eppler, James C Bezdek, G Robert Redinbo, Julius T Tou, Keishi Gotoh, and the editors. Near Fine/no dj 0-8493-5781-0.
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Particle Characterization in Technology, Vol. 1: Applications and Microanalysis
Seller: Phatpocket Limited, Waltham Abbey, HERTS, United Kingdom
Seller rating 5 out of 5 stars
Condition: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
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Image Analysis Sourcebook
Language: English
Published by American Universities Sicence and Technology Press, Santa Barbara, California, U.S.A., 1997
ISBN 10: 096175317X ISBN 13: 9780961753177
Hard Cover. Condition: Good. No Jacket. The interior is clean and tight. Binding is good. Cover is good. 390 pages including index.
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![Seller image for Particle Characterization in Technology [ 2 volumes ] I. Applications and Microanalysis II. Morphological Analysis. [ Second printing ]. for sale by Emile Kerssemakers ILAB](https://pictures.abebooks.com/inventory/md/md31955007203.jpg)
Particle Characterization in Technology [ 2 volumes ] I. Applications and Microanalysis II. Morphological Analysis. [ Second printing ].
Language: English
Published by CRC Press, Inc., Boca Raton, Florida, 1985
ISBN 10: 0849357845 ISBN 13: 9780849357848
Seller: Emile Kerssemakers ILAB, Heerlen, Netherlands
Seller rating 5 out of 5 stars
2 vols. Original hardcovers. xviii,246 pp. & xviii,266 pp.; ills.; 26x18 cm. " Uniscience Series on Fine Particle Science and Technology " Text in English. - (trace of removed label on spines, stamp on endpapers, small signs of use) Although (very) good, see picture 1820g.
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Particulate Systems: Technology and Fundamentals
Language: English
Published by Hemisphere Publishing Company, 1983
ISBN 10: 0891162410 ISBN 13: 9780891162414
Hardcover. Condition: UsedVeryGood. Hardcover; light fading, light shelf wear to exterior; former owner's stamping on inside front board, copyright page; otherwise in very good condition with clean text, firm binding.
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Hardcover. Condition: Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: As New. Unread book in perfect condition.
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Condition: New.
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Advanced Particulate Morphology
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Advanced Particulate Morphology
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Condition: As New. Unread book in perfect condition.
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Gebunden. Condition: New. John Keith BeddowThis volume, based on the 1977 NSF Residential Advanced Particle Morphology Workshop, covers the principle developments in this new and rapidly evolving field. The divergent fields of interst of the authors reflect the prosepcts for the.
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Particle Characterization in Technology : Application and Microanalysis
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Particle Characterization in Technology : Application and Microanalysis
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Advanced Particulate Morphology
Language: English
Published by Taylor & Francis Ltd Nov 2017, 2017
ISBN 10: 1315890445 ISBN 13: 9781315890449
Buch. Condition: Neu. Neuware.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. John Keith Beddow Professor of Chemicals and Materials Engineering, Division of Materials Engineering, University of Iowa.Volume I present an important exposition of some of the most significant areas where particle characterization is applied. The .
